燃烧流体测量设备分站

北京欧兰科技发展有限公司

 



成像椭偏仪:
Ellipsometry is a very sensitive measurement technique that uses polarized light to characterize thin films, surfaces, and material microstructure. Usually the polarization of light changes upon reflection. These changes are measured by an ellipsometer and interpreted on the basis of model calculations. Ellipsometry can also be used to build a novel microscopy giving unique insights in the sample:

What information can be obtained?
· Layer Thickness with an accuracy of 0.1nm
· Optical constants of a substrate
· Orientation of molecules
· Mass coverages at surfaces
· Visualization of textures and morphology

The data accumulation is fast that you can follow in situ changes at interfaces such as corrosion, adsorption and so on. Ellipsometry is a versatile technology that has been used for over a century. The following guides you through some key concepts.
基于博卡先锋SiteEngine构建
北京欧兰科技发展有限公司 版权所有 电子邮件:info@oplanchina.com,oplan@263.net
联系电话:010-62623871, 62616041,62612809 传真:010-59713638
地址:北京市海淀区上地十街1号辉煌国际中心1号楼1006室 邮政编码:100085   京ICP备07038319号-2
Processed in 0.090 second(s), 3 queries