燃烧流体测量设备分站

北京欧兰科技发展有限公司

 



Design

  • Far field imaging
  • Detection via an intermediate image on the surface of a blazed grating
  • Upgradeable option of standard EKSPLA SFG spectrometer

Principal layout of Sum Frequency Generation (SFG) imaging spectrometer:

 

An image of ODT covered etched gold sample:

The lines are spaced, in order left-right 20, 5, 2, and 8 micrometers. Image taken at ωIR=2875 cm⁻¹ and acquired for 5000 laser shots. Courtesy of University of Houston

 

Specifications

Resolution < 5 µm
Field of view 300 µm
Magnification 20
VIS beam wavelength 1064.2 nm
IR wavelength range 2000-3800 cm-1
CCD Roper Scientific ICCD 1024x1024

 

基于博卡先锋SiteEngine构建
北京欧兰科技发展有限公司 版权所有 电子邮件:info@oplanchina.com,oplan@263.net
联系电话:010-62623871, 62616041,62612809 传真:010-59713638
地址:北京市海淀区上地十街1号辉煌国际中心1号楼1006室 邮政编码:100085   京ICP备07038319号-2
Processed in 0.049 second(s), 3 queries